Two Selected for Natrella Scholarship

Will Guthrie, Natrella Scholarship Selection Committee Chair

    Bui

    Yue

    The Quality and Productivity Section will award Mary G. and Joseph Natrella scholarships to Anh Bui, a PhD candidate in industrial engineering and management sciences at Northwestern University, and Xiaowei Yue, a PhD candidate in the department of industrial and systems engineering at the Georgia Institute of Technology, during the 2018 Joint Research Conference on Statistics in Quality, Industry, and Technology, which will be held June 11–14 in Santa Fe, New Mexico.

    Both Bui and Yue will give a research presentation at the conference and receive a $3,500 scholarship, plus $500 for travel expenses and complimentary registration for the conference and pre-conference short course.

    Bui was recommended for the award by Daniel W. Apley of Northwestern University and Chi-Hyuck Jun of Pohang University of Science and Technology in Pohang, South Korea. His presentation at the conference is titled, “Monitoring Stochastic Textured Surfaces.”

    Yue was recommended for the award by Jianjun Shi and Chuck Zhang of Georgia Institute of Technology. The title of his presentation is “Engineering-Driven Data Analytics for Quality Improvement.”

    The winners were chosen for their outstanding teaching, community service, mentoring, leadership, scholarship, and commitment to the pursuit of quality improvement through the use of statistical methods.